Wafer inspection system
Input: Wafer · Output: Inspected wafer
- High-precision X-Y table, up to 12 inch wafers
- Built-in calibration and automatic GR&R report
- Automated defect classification and wafer map updates
- Optional inking for defective dies
Our mission is to provide the right solution for integration systems and process engineering needs.
Input: Wafer · Output: Inspected wafer
Input: Un-inspected wafer cassette · Output: Inspected wafer cassette
Input: Leadframe or board · Output: Leadframe or board
Input: Tray or leadframe · Output: Tray or leadframe
Input: Tube · Output: Tube
Input: Loose or tube · Output: Tube
Input: Reel · Output: Tray
Input: Tube · Output: Tube or bin
Input: Tray · Output: Tray
Input: Tray, loose or tube · Output: Tape & reel
Input: Tray, loose or tube · Output: Tape & reel